Shanghai Zenfocus Semiconductor has the ability to independently develop, design, produce and test MEMS probes, and can customize MEMS probes according to customers' needs, and can support applications such as High Density, High pin count, high speed and high frequency. The MEMS probe card provided by our company can be widely used in testing chip products such as mobile phone processor AP, high performance computing HPC, intelligent AI, vehicle RF, etc. Our probe card supports a minimum Pitch of 54um, a maximum signal test rate of 60Gbps(PAM4) and a maximum test current of 510A.